[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture
Zhang, Fanchen, Hwong, Daphne, Sun, Yi, Garcia, Allison, Alhelaly, Soha, Shofner, Geoff, Winemberg, LeRoy, Dworak, JenniferYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805828
File:
PDF, 638 KB
english, 2016