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[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Defect tolerance for CNFET-based SRAMs
Li, Tianjian, Jiang, Li, Liang, Xiaoyao, Xu, Qiang, Chakrabarty, KrishnenduYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805833
File:
PDF, 1.09 MB
english, 2016