[IEEE 2016 IEEE International Test Conference (ITC) - Fort...

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[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Online slack-time binning for IO-registered die-to-die interconnects

Zheng, Chih-Chieh, Huang, Shi-Yu, Lu, Shyue-Kung, Wang, Ting-Chi, Tsai, Kun-Han, Cheng, Wu-Tung
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Year:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805848
File:
PDF, 575 KB
english, 2016
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