[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Known-good-die test methods for large, thin, high-power digital devices
Armstrong, Dave, Maier, GaryYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805851
File:
PDF, 403 KB
english, 2016