[IEEE 2016 IEEE International Test Conference (ITC) - Fort...

  • Main
  • [IEEE 2016 IEEE International Test...

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board

Nakura, Toru, Terao, Naoki, Ishida, Masahiro, Ikeno, Rimon, Kusaka, Takashi, Iizuka, Tetsuya, Asada, Kunihiro
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805860
File:
PDF, 587 KB
english, 2016
Conversion to is in progress
Conversion to is failed