![](/img/cover-not-exists.png)
[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board
Nakura, Toru, Terao, Naoki, Ishida, Masahiro, Ikeno, Rimon, Kusaka, Takashi, Iizuka, Tetsuya, Asada, KunihiroYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805860
File:
PDF, 587 KB
english, 2016