[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis
Coyette, Anthony, Esen, Baris, Dobbelaere, Wim, Vanhooren, Ronny, Gielen, GeorgesYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805867
File:
PDF, 367 KB
english, 2016