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[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath
Devanathan, V. R., Kale, SumantYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805870
File:
PDF, 660 KB
english, 2016