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[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors
Johnson, Michael, Noble, Brian, Johnson, Mark, Crafts, Jim, Manya, Cynthia, Deforge, JohnYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805871
File:
PDF, 377 KB
english, 2016