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[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Pylon: Towards an integrated customizable volume diagnosis infrastructure
Pan, Yan, Desineni, Rao, Sekar, Kannan, Chittora, Atul, Fernandes, Sherwin, Bawaskar, Neerja, Carulli, JohnYear:
2016
Language:
english
DOI:
10.1109/TEST.2016.7805872
File:
PDF, 421 KB
english, 2016