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Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometry
Arteaga, Oriol, Nichols, Shane M., Antó, JoanLanguage:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2016.10.129
Date:
October, 2016
File:
PDF, 1.93 MB
english, 2016