X-ray diffraction and leaching of CsAlSi5O12and...

Journal of Materials Science 1984 / 09 Vol. 19; Iss. 9

X-ray diffraction and leaching of CsAlSi5O12and CsZr2(PO4)3irradiated by argon (3 MeV) ions

E. R. Vance, L. Cartz, F. G. Karioris
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Volume:
19
Language:
english
Pages:
5
DOI:
10.1007/bf01026971
Date:
September, 1984
File:
PDF, 449 KB
english, 1984
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