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Ferroelectric and dielectric study of strontium tantalum based perovskite oxynitride films deposited by reactive rf magnetron sputtering
Le Paven, C., Benzerga, R., Ferri, A., Fasquelle, D., Laur, V., Le Gendre, L., Marlec, F., Tessier, F., Cheviré, F., Desfeux, R., Saitzek, S., Castel, X., Sharaiha, A.Language:
english
Journal:
Materials Research Bulletin
DOI:
10.1016/j.materresbull.2016.11.030
Date:
November, 2016
File:
PDF, 1.36 MB
english, 2016