A new meshing criterion for the equivalent thermal analysis...

Microelectronics Reliability 2017 / 01 Vol. 68

A new meshing criterion for the equivalent thermal analysis of GaAs PHEMT MMICs

Xu, Xiuqin, Mo, Jiongjiong, Chen, Wei, Wang, Zhiyu, Shang, Yongheng, Wang, Yang, Zheng, Qin, Wang, Liping, Huang, Zhengliang, Yu, Faxin
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Volume:
68
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.11.012
Date:
January, 2017
File:
PDF, 1.65 MB
english, 2017
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