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Microstructure and optoelectronic performance of SiGe/Si heterostructures
Zhang, Dainan, Hart, John, Kolodzey, James, Liao, Yulong, Jin, Lichuan, Fernando, Malnaidelage Nalin, Rao, Yiheng, Hong, CaiyunLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.11.013
Date:
December, 2016
File:
PDF, 1.24 MB
english, 2016