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An enhanced MOSFET threshold voltage model for the 6–300K temperature range
Dao, Nguyen Cong, Kass, Abdallah El, Azghadi, Mostafa Rahimi, Jin, Craig T., Scott, Jonathan, Leong, Philip H.W.Volume:
69
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.12.007
Date:
February, 2017
File:
PDF, 681 KB
english, 2017