Film thickness by interference pattern and optical...

Synthetic Metals 2017 / 01 Vol. 223

Film thickness by interference pattern and optical characterization of polyaniline by spectroscopic ellipsometry

de Lima Filho, Joaquim Brasil, Hidalgo, Ángel Alberto
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Volume:
223
Language:
english
Journal:
Synthetic Metals
DOI:
10.1016/j.synthmet.2016.11.025
Date:
January, 2017
File:
PDF, 856 KB
english, 2017
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