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[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Development of technologies, methods and devices of the functional diagnostics of microelectronic sensors parts and components
Ozhikenov, Kasymbek A., Mikhailov, Peter G., Ismagulova, Rauzia S., Azamatova, Zhanerke K., Azamatov, Bagdat N.Year:
2016
DOI:
10.1109/APEIE.2016.7802218
File:
PDF, 943 KB
2016