[IEEE 2016 13th International Scientific-Technical...

[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - “In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

Antonov, Andrey A., Karpovich, Maksim S., Pichugin, Igor V., Vasilyev, Vladislav Yu.

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Year:

2016

Language:

english

DOI:

10.1109/APEIE.2016.7806944

File:

PDF, 3.10 MB

english, 2016

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