![](/img/cover-not-exists.png)
[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Verification “in silicon” active output rectifier controller IC in 250 nm BCD technology for high-efficiency power converters
Ryzhkov, Vladimir A., Antonov, Andrey A., Karpovich, Maksim S., Surin, Igor K, Vasilyev, Vladislav Yu.Year:
2016
Language:
english
DOI:
10.1109/APEIE.2016.7807076
File:
PDF, 2.24 MB
english, 2016