[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu,...

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[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - Proof of Han's hypothesis on relations among two-sided M-Bayesian credible limits and corresponding two-sided classical confidence limits

Dai, Wanyi, Hu, Yueming, Li, Siqi, Zhang, Mei, Mei, Dongfang
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Year:
2016
Language:
english
DOI:
10.1109/chicc.2016.7554412
File:
PDF, 228 KB
english, 2016
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