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[IEEE 2016 IEEE International Conference on Imaging Systems and Techniques (IST) - Chania, Greece (2016.10.4-2016.10.6)] 2016 IEEE International Conference on Imaging Systems and Techniques (IST) - Fast visual part inspection for bin picking
Rofalis, Nikolaos, Olesen, Anders S., Jakobsen, Michael L., Kruger, VolkerYear:
2016
Language:
english
DOI:
10.1109/ist.2016.7738261
File:
PDF, 3.26 MB
english, 2016