An XPS study of amorphous MoO3/SiO films deposited by...

An XPS study of amorphous MoO3/SiO films deposited by co-evaporation

M. Anwar, C. A. Hogarth, R. Bulpett
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Volume:
25
Language:
english
Pages:
5
DOI:
10.1007/bf01045385
Date:
March, 1990
File:
PDF, 431 KB
english, 1990
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