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AIP Conference Proceedings [AIP Publishing LLC ADVANCED MATERIALS AND RADIATION PHYSICS (AMRP-2015): 4th National Conference on Advanced Materials and Radiation Physics - Longowal, India (13–14 March 2015)] - Trace elemental analysis of school chalk using energy dispersive X-ray florescence spectroscopy (ED-XRF)
Maruthi, Y. A., Das, N. Lakshmana, Ramprasad, S., Ram, S. S., Sudarshan, M.Volume:
1675
Year:
2015
Language:
english
DOI:
10.1063/1.4929304
File:
PDF, 186 KB
english, 2015