[IEEE 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2016.10.10-2016.10.13)] 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - In-pixel A/D converters with 120-dB dynamic range using event-driven correlated double sampling for stacked SOI image sensors

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