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[IEEE 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Burlingame, CA, USA (2016.10.10-2016.10.13)] 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) - Competitive 1T-DRAM in 28 nm FDSOI technology for low-power embedded memory
Dirani, H. El, Bawedin, M., Lee, K., Parihar, M., Mescot, X., Fonteneau, P., Galy, Ph., Gamiz, F., Kim, Y-T., Ferrari, P., Cristoloveanu, S.Year:
2016
Language:
english
DOI:
10.1109/S3S.2016.7804402
File:
PDF, 449 KB
english, 2016