An almost knowledge-free approach to XPS intensity evaluation where use of atomic photoemission cross sections suffices for yielding material-specific inelastic background
Jo, MasatoshiVolume:
215
Language:
english
Journal:
Journal of Electron Spectroscopy and Related Phenomena
DOI:
10.1016/j.elspec.2016.12.014
Date:
February, 2017
File:
PDF, 1.24 MB
english, 2017