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Performance degradation of superlattice MOSFETs due to scattering in the contacts
Long, Pengyu, Huang, Jun Z., Jiang, Zhengping, Klimeck, Gerhard, Rodwell, Mark J. W., Povolotskyi, MichaelVolume:
120
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4971341
Date:
December, 2016
File:
PDF, 2.08 MB
english, 2016