An in situ synchrotron XAS...

Review of Scientific Instruments 2017 / 01 Vol. 88; Iss. 1

An in situ synchrotron XAS methodology for surface analysis under high temperature, pressure, and shear

Dorgham, A., Neville, A., Ignatyev, K., Mosselmans, F., Morina, A.
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Volume:
88
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4973354
Date:
January, 2017
File:
PDF, 2.17 MB
english, 2017
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