[IEEE 2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE) - Chengdu, China (2016.9.19-2016.9.22)] 2016 IEEE International Conference on High Voltage Engineering and Application (ICHVE) - Study on the influence of secondary load to the error characteristics of CVT
Liu, Kun, Wang, Ruihan, Zhang, Xiang, Jiang, Wei, Li, Yongsen, Chen, WeigenYear:
2016
Language:
english
DOI:
10.1109/ICHVE.2016.7800872
File:
PDF, 639 KB
english, 2016