Effect of illumination on the hump phenomenon in...

physica status solidi (a) 2017 / 01

Effect of illumination on the hump phenomenon in I - V characteristics of amorphous InGaZnO TFTs under positive gate-bias stress

Cho, Yong-Jung, Lee, Yeol-Hyeong, Kim, Woo-Sic, Kim, Byeong-Koo, Park, Kyung Tae, Kim, Ohyun
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Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201600503
Date:
January, 2017
File:
PDF, 1.39 MB
english, 2017
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