Understanding the thickness-dependent effective lifetime of crystalline silicon passivated with a thin layer of intrinsic hydrogenated amorphous silicon using a nanometer-accurate wet-etching method
Deligiannis, Dimitrios, Marioleas, Vasileios, Vasudevan, Ravi, Visser, Cassan C. G., van Swaaij, René A. C. M. M., Zeman, MiroVolume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4954069
Date:
June, 2016
File:
PDF, 884 KB
english, 2016