Quantifying the intrinsic surface charge density and...

Applied Physics Letters 2016 / 07 Vol. 109; Iss. 1

Quantifying the intrinsic surface charge density and charge-transfer resistance of the graphene-solution interface through bias-free low-level charge measurement

Ping, Jinglei, Johnson, A. T. Charlie
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Volume:
109
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4955404
Date:
July, 2016
File:
PDF, 687 KB
english, 2016
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