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Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
Van Der Hofstadt, M, Fabregas, R, Biagi, M C, Fumagalli, L, Gomila, GVolume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/40/405706
Date:
October, 2016
File:
PDF, 2.62 MB
english, 2016