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[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - A Study on the Transfer Function Based Analog Fault Model for Linear and Time-Invariant Continuous-Time Analog Circuits
Hong, Hao-Chiao, Lin, Long-YiYear:
2016
Language:
english
DOI:
10.1109/ATS.2016.38
File:
PDF, 172 KB
english, 2016