[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture
Kumar, Binod, Nehru, Boda, Pandey, Brajesh, Singh, Virendra, Tudu, JaynarayanYear:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807675
File:
PDF, 164 KB
english, 2016