Stability, Instability, and Bifurcation in Electrified Thin...

Stability, Instability, and Bifurcation in Electrified Thin Films

Fontelos, Marco A., Hwang, Hyung Ju, Oh, Youngmin
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Volume:
48
Language:
english
Journal:
SIAM Journal on Mathematical Analysis
DOI:
10.1137/15M1010762
Date:
January, 2016
File:
PDF, 692 KB
english, 2016
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