![](/img/cover-not-exists.png)
Stability, Instability, and Bifurcation in Electrified Thin Films
Fontelos, Marco A., Hwang, Hyung Ju, Oh, YoungminVolume:
48
Language:
english
Journal:
SIAM Journal on Mathematical Analysis
DOI:
10.1137/15M1010762
Date:
January, 2016
File:
PDF, 692 KB
english, 2016