Low Frequency Excess Noise Source Investigation of...

IEEE Transactions on Magnetics 2017 / 1 Vol. 53; Iss. 1

Low Frequency Excess Noise Source Investigation of Off-Diagonal GMI-Based Magnetometers

Dufay, B., Portalier, E., Saez, S., Dolabdjian, C., Seddaoui, D., Yelon, A., Menard, D.
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Volume:
53
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2016.2615597
Date:
January, 2017
File:
PDF, 568 KB
english, 2017
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