Modeling of the switching I-V characteristics in ultrathin...

Modeling of the switching I-V characteristics in ultrathin (5 nm) atomic layer deposited HfO 2 films using the logistic hysteron

Blasco, Julio, Jančovič, Peter, Fröhlich, Karol, Suñé, Jordi, Miranda, Enrique
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4900599
Date:
January, 2015
File:
PDF, 2.07 MB
english, 2015
Conversion to is in progress
Conversion to is failed