Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions
MIYAKE, Masataka, NAKASHIMA, Junichi, MIURA-MATTAUSCH, MitikoVolume:
E95.C
Year:
2012
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e95.c.1682
File:
PDF, 1.79 MB
english, 2012