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[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - No-reference image quality assessment based on local binary patterns
Nenakhov, I., Khryashchev, V., Priorov, A.Year:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807685
File:
PDF, 661 KB
english, 2016