Switching Kinetics in Nanoscale Hafnium Oxide Based Ferroelectric Field-Effect Transistors
Mulaosmanovic, Halid, Ocker, Johannes, Müller, Stefan, Schroeder, Uwe, Müller, Johannes, Polakowski, Patrick, Flachowsky, Stefan, van Bentum, Ralf, Mikolajick, Thomas, Slesazeck, StefanVolume:
9
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b13866
Date:
February, 2017
File:
PDF, 1.17 MB
english, 2017