Length-Dependent Electromigration Behavior of Sn58Bi Solder and Critical Length of Electromigration
Zhao, Xu, Muraoka, Mikio, Saka, MasumiVolume:
46
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-5093-1
Date:
February, 2017
File:
PDF, 747 KB
english, 2017