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[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Definition of MIMO technology noise immunity by correlated channels
Nosov, V.I., Yantsen, A.S.Year:
2016
DOI:
10.1109/APEIE.2016.7806879
File:
PDF, 1.37 MB
2016