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[IEEE 2016 4th IEEE International Colloquium on Information Science and Technology (CIST) - Tangier, Morocco (2016.10.24-2016.10.26)] 2016 4th IEEE International Colloquium on Information Science and Technology (CiSt) - A measurement model for factors influencing data quality in data warehouse
Zellal, Nouha, Zaouia, AbdellahYear:
2016
Language:
english
DOI:
10.1109/CIST.2016.7805102
File:
PDF, 2.72 MB
english, 2016