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[IEEE 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Shenzhen, China (2016.5.17-2016.5.21)] 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) - Methodical principles of a choice of simulators for tests of electronic devices for immunity to ultrashort EMPs
Parfenov, Yury V., Zdoukhov, Leonid N., Chepelev, Vladimir M., Titov, Boris A., Radasky, William A.Year:
2016
Language:
english
DOI:
10.1109/apemc.2016.7523015
File:
PDF, 3.79 MB
english, 2016