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Partial least square regression: an analysis tool for quantitative non-destructive testing
Le Bihan, Yann, Pávó, József, Marchand, ClaudeVolume:
67
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap/2014130487
Date:
September, 2014
File:
PDF, 485 KB
english, 2014