[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis of the transverse distribution of the micro-strip line capacitance
Rubanovich, Mikhail G., Stolyarenko, Aleksey A., Khrustalev, Vladimir A., Vagin, Denis V., Mitkov, Aleksander S., Aubakirov, Konstantin Ya.Year:
2016
DOI:
10.1109/APEIE.2016.7802183
File:
PDF, 720 KB
2016