[IEEE 2016 13th International Scientific-Technical...

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[IEEE 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2016.10.3-2016.10.6)] 2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Analysis of the transverse distribution of the micro-strip line capacitance

Rubanovich, Mikhail G., Stolyarenko, Aleksey A., Khrustalev, Vladimir A., Vagin, Denis V., Mitkov, Aleksander S., Aubakirov, Konstantin Ya.
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Year:
2016
DOI:
10.1109/APEIE.2016.7802183
File:
PDF, 720 KB
2016
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