[IEEE 2016 International Conference on Integrated Circuits and Microsystems (ICICM) - Chengdu, China (2016.11.23-2016.11.25)] 2016 International Conference on Integrated Circuits and Microsystems (ICICM) - Electrical property and reliability of quasi-double SOI MOSFET
Mao, Guang, Xie, Lei, Ren, Shangqing, Yang, Renhua, Liu, Xin, Zhong, Le, Lv, Qiuye, Peng, YongYear:
2016
Language:
english
DOI:
10.1109/ICAM.2016.7813590
File:
PDF, 359 KB
english, 2016