Electrical characteristics of tunneling field-effect transistors with asymmetric channel thickness
Kim, Jungsik, Oh, Hyeongwan, Kim, Jiwon, Meyyappan, M., Lee, Jeong-SooVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.024201
Date:
February, 2017
File:
PDF, 1.04 MB
english, 2017