Defects evolution and their impacts on conductivity of indium tin oxide thin films upon thermal treatment
Li, Qichao, Mao, Wenfeng, Zhou, Yawei, Yang, Chunhong, Liu, Yong, He, ChunqingVolume:
118
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4923392
Date:
July, 2015
File:
PDF, 2.62 MB
english, 2015